Are Trench FETs Too Fragile for Linear Applications?

by Jeffrey A. Ely, Staff Development Engineer, Advanced Engineering Energenix Center, Power Electronics Technology, Jan 01 2004

Focus:
A comparison of the forward-biased safe-operating-area (FB-SOA) performance of one trench and one planar device of similar die size is presented. The results educate designers on issues concerning trench and planar MOSFETs in the linear region of the device operating characteristics.

What you’ll learn:

• How to evaluate the durability of trench MOSFETs operating in the linear region
• How to prevent failure of MOSFETs operating in the linear region

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