by Jos van Loo, Taiwan Semiconductor Europe, Zorneding, Germany and Kevin Parmenter, Taiwan Semiconductor America, Chandler, Ariz., How2Power Today, Sep 16 2019
Focus:
To minimize field returns and achieve zero defects when designing with rectifiers,
designers need a good understanding of rectifier manufacturing processes, test programs
and statistics. Datasheets are not always helpful in this regard because some
rectifiers and datasheets are 30 to 50 years old and in general rectifier datasheets
follow outmoded conventions. This article discusses the key specifications that
designers must consider when selecting standard silicon rectifiers and bridge
rectifiers, and explains how semiconductor manufacturers test and then specify these
parameters. This in turn leads to advice on how designers should interpret or apply
this data. Discussion covers absolute maximum ratings such as surge current and
breakdown voltage; related parameters such as I2t data and delta Vf; and maximum
junction temperature, and the specs (thermal resistance and the forward current
derating curve) designers use to calculate their junction temperatures. Guidance is
provided on cross referencing rectifiers from different suppliers and how to evaluate
device reliability. Issues such as leakage current, Cpk values and part average testing
are also discussed.
What you’ll learn:
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