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Avoiding Thermal Runaway In Schottkys Is Key To More Reliable And Efficient Designs

by Jos van Loo, Taiwan Semiconductor Europe, Zorneding, Germany and Kevin Parmenter, Taiwan Semiconductor America, Chandler, Ariz., How2Power Today, Oct 15 2020

Focus:
Schottky diodes are used increasingly in applications where there is a combination of high ambient temperatures and higher voltages present, making them vulnerable to thermal runaway. By better understanding how the maximum Tj of a Schottky diode is defined and why thermal runaway happens, design engineers will be able to build more efficient and more reliable products. This article looks at the factors that lead to thermal runaway and describes its two forms—static and dynamic. It also discusses the importance of reliability testing and thermal modeling in avoiding thermal runaway. Much of this discussion revolves around a Schottky rectifier’s forward voltage and leakage current specifications, how they influence thermal performance, junction temperatures, reliability, efficiency, and aspects of Schottky device structure that influence these two specifications. The article also discusses second sourcing of Schottkys and the impact of packaging on thermal runaway.

What you’ll learn:

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