Timeline of Power MOSFET Single Event Burnout Papers

by Jerrold Foutz, SMPS Technology, Sep 05 2005

Focus:
Taking advantage of his many years of experience designing radiation-hardened power supplies Foutz has created "a timeline of citations, abstracts, and comments on papers supporting Power MOSFET Single Event Burnout." The collection includes conference papers, IEEE transactions, application notes, and books that address a number of failure modes caused by cosmic radiation including single event burnout (SEB), single event gate rupture (SEGR), single event gate damage (SEGD), single event effects (SEE), and single event upset (SEU).

What you’ll learn:

• How to identify sources of information on single-event burnout

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